High Temperature Experiments for Circuit Self-Recovery

Didier Keymeulen¹, Ricardo Zebulum¹, Vu Duong¹, Xin Guo^1,2, Ian Ferguson¹, and Adrian Stoica¹

¹Jet Propulsion Laboratory 4800 Oak Grove Drive, Pasadena, CA 91109, USA
didier.keymeulen@jpl.nasa.gov

²Chromatech Alameda CA 94501

Abstract. Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for extreme environments focus on component level robustness and hardening. Compensation techniques such as bias cancellation circuitry have also been employed. However, current technology can only ensure very limited lifetime in extreme environments. This paper presents a novel approach, based on evolvable hardware technology, which allows adaptive in-situ circuit redesign/reconfiguration during operation in extreme environments. This technology would complement material/device advancements and increase the mission capability to survive harsh environments. The approach is demonstrated on a mixed-signal programmable chip, which recovers functionality until 280°C. We show in this paper the functionality recovery at high temperatures for a variety of circuits, including rectifiers, amplifiers and filters.

LNCS 3102, p. 792 ff.

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